Description
The Reflection Geometry system allows electric fields of ±5kV to be applied to bulk materials while conducting XRD measurements from a surface. Ideal for electro-ceramic and single crystal research in laboratory or synchrotron x-ray systems. Electrical current and displacements sensors are packaged within the unit allowing simultaneous strain and polarization measurements.
Specifications
- Suitable for most laboratory based x-ray diffractometers and synchrotron sources
- For example: Bruker D8, Rigaku SmartLab, Pan-Analytical Empyrean and X'Pert
- Mechanical strain and electrical polarisation measurements in situ
- Applied voltages ±5 kV
- Recommended external amplifier is the Trek 10/10B-HS, although custom cabling for alternative amplifiers is possible upon request
- Silicon oil can be used in horizontal geometry to increase achievable field
- Sample diameters of 7 mm to 12 mm
- Sample thicknesses of 0.1 mm to 2 mm
- Temperature range from room temperature to 200°C
- Large scattering angle range, including grazing incidence angles
- Compact system design for maximum portability and versatility
- Interlocked for safety with voltage application only possible when cell is closed
Please Note
Compatibility of a particular diffractometer will depend on its configuration. Please discuss with our contact staff to understand if your system is suitable.
