Bulk Reflection Geometry
– 1 minute to read
Description
Specifications
- Suitable for most laboratory based x-ray diffractometers and synchrotron sources,
- For example*: Bruker D8, Rigaku SmartLab, PanAnalytical Empyrean and X'Pert.
- Mechanical strain and electrical polarisation measurements in situ.
- Applied voltages ±5 kV,
- Recommended external amplifier is the Trek 10/10B-HS, although custom cabling for alternative amplifiers is possible upon request.
- Silicon oil can be used in horizontal geometry to increase achievable field.
- Sample diameters of 7 mm to 12 mm.
- Sample thicknesses of 0.1 mm to 2 mm.
- Temperature range from room temperature to 200°C.
- Large scattering angle range, including grazing incidence angles.
- Compact system design for maximum portability and versatility.
- Interlocked for safety with voltage application only possible when cell is closed.
Please Note
Related Products
Working with high-energy x-rays offers some advantages in the study of bulk electro-mechanical materials. The Transmission Geometry system is ideally suited for use at high-energy synchrotron x-ray beamlines or lab sources with higher energy targets such as Ag or Mo. Precise polarization and strain measurements can be obtained in-situ at voltages up to ±7.5 kV.
The Thin Film measurement system packages an entire probe station into a compact head unit for use within existing XRD equipment. While conducting structural XRD measurements, static or cyclic fields between ±50V can be applied. Current, polarization, I-V and C-V curve measurements can be obtained simultaneously.
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Demonstration
Related Products
Working with high-energy x-rays offers some advantages in the study of bulk electro-mechanical materials. The Transmission Geometry system is ideally suited for use at high-energy synchrotron x-ray beamlines or lab sources with higher energy targets such as Ag or Mo. Precise polarization and strain measurements can be obtained in-situ at voltages up to ±7.5 kV.
The Thin Film measurement system packages an entire probe station into a compact head unit for use within existing XRD equipment. While conducting structural XRD measurements, static or cyclic fields between ±50V can be applied. Current, polarization, I-V and C-V curve measurements can be obtained simultaneously.