Critus XRD
![Product Bulk Transmission Geometry](/_gatsby/image/5fc75b91cb0176014230296428ce8897/89c93600785f6e1555486c194acc1d81/IMG_0102.jpg?u=https%3A%2F%2Fimages.ctfassets.net%2F9uejui175jzg%2F3Zez13l1L6slV1hRpaFur%2Fc8c102fbd2f12e69d390cc4fbe220470%2FIMG_0102.JPG&a=w%3D750%26h%3D375%26fm%3Djpg%26q%3D75&cd=2023-09-01T02%3A16%3A57.793Z)
Working with high-energy x-rays offers some advantages in the study of bulk electro-mechanical materials. The Transmission Geometry system is ideally suited for use at high-energy synchrotron x-ray beamlines or lab sources with higher energy targets such as Ag or Mo. Precise polarization and strain measurements can be obtained in-situ at voltages up to ±7.5 kV.
![Product Bulk Reflection Geometry](/_gatsby/image/3717847a28876861fde13116c6ce9588/f827427280341b20da9eb0ab4d3eed46/RigakuSmartlabRCell.png?u=https%3A%2F%2Fimages.ctfassets.net%2F9uejui175jzg%2F7FqS5ouN8KrFMml82OCeEH%2F8e634c25313f5011e734b055a194b5c4%2FRigakuSmartlabRCell.png&a=w%3D750%26h%3D375%26fm%3Dpng%26q%3D75&cd=2022-08-24T07%3A18%3A54.611Z)
The Reflection Geometry system allows electric fields of ±5kV to be applied to bulk materials while conducting XRD measurements from a surface. Ideal for electro-ceramic and single crystal research in laboratory or synchrotron x-ray systems. Electrical current and displacements sensors are packaged within the unit allowing simultaneous strain and polarization measurements.
![Product Thin Film](/_gatsby/image/832c69c1fa25bab7fdc78c8d52058b14/f827427280341b20da9eb0ab4d3eed46/BrukerD8SmallSnapshotTFCell.png?u=https%3A%2F%2Fimages.ctfassets.net%2F9uejui175jzg%2F2CUY8qdZ3fJZRZpeybJlu5%2Fac0de9df607a9b599c19c03ee400e493%2FBrukerD8SmallSnapshotTFCell.png&a=w%3D750%26h%3D375%26fm%3Dpng%26q%3D75&cd=2022-08-25T02%3A46%3A12.206Z)
The Thin Film measurement system packages an entire probe station into a compact head unit for use within existing XRD equipment. While conducting structural XRD measurements, static or cyclic fields between ±50V can be applied. Current, polarization, I-V and C-V curve measurements can be obtained simultaneously.
![](/_gatsby/image/eca620aea3e570cf3409cec9bab4a69f/0b7c201a7c22e7089b1afafa3907701b/Warning%20TCell.png?u=https%3A%2F%2Fimages.ctfassets.net%2F9uejui175jzg%2F4cmfUdb7fCalY4kY3gb0Yb%2F1c9856cb52b8feddebaf7bc48bd67648%2FWarning_TCell.png&a=w%3D181%26h%3D227%26fm%3Dpng%26q%3D75&cd=2022-09-02T02%3A41%3A13.348Z)
![](/_gatsby/image/44cd8914b6313b2d0b650cf803e37d48/60640472a4ecbb6821ed57a4c527688a/PropertyStructureCroppedTransparent.png?u=https%3A%2F%2Fimages.ctfassets.net%2F9uejui175jzg%2F35MLtukhh1ClVc4hXAWtFI%2F649290a96214968390141208583d26bd%2FPropertyStructureCroppedTransparent.png&a=w%3D320%26h%3D153%26fm%3Dpng%26q%3D75&cd=2022-08-30T01%3A58%3A15.231Z)
![](/_gatsby/image/e1b78018a39f23dd1059a0fc7f11e192/c211d6159f2e6000028cca5f33807127/TF_Cell_Connections_WithOverlay.jpg?u=https%3A%2F%2Fimages.ctfassets.net%2F9uejui175jzg%2F14FYp5dzb5a1RnvxZwyEwn%2F8cf036ade515171cf8db1d2c362a0d3e%2FTF_Cell_Connections_WithOverlay.jpg&a=w%3D320%26h%3D240%26fm%3Djpg%26q%3D75&cd=2022-09-01T10%3A21%3A03.999Z)