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Thin Film

A probe station in a form factor for mounting to a variety of XRD instrumentation. Suitable for most laboratory based x-ray diffractometers and synchrotron sources. For example*: Bruker D8, Rigaku SmartLab, Pan​Analytical Empyrean and X'Pert.

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Thin-Film
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TF-Cell

Description

The Thin Film measurement system packages an entire probe station into a compact head unit for use within existing XRD equipment. While conducting structural XRD measurements, static or cyclic fields between ±50V can be applied. Current, polarization, I-V and C-V curve measurements can be obtained simultaneously.

Specifications

  • Suitable for most laboratory based x-ray diffractometers and synchrotron sources.
  • For example*: Bruker D8, Rigaku SmartLab, Pan​Analytical Empyrean and X'Pert.
  • Depending on feature size of interest, x-ray beam focusing options may be required.
  • Polarization, I-V and C-V curve measurements in situ.
  • Applied voltages ±50V.
  • Sample diameters up to 15 mm with probe tip positioning over full area.
  • Sample/substrate thicknesses up to 3 mm.
  • Temperature range from room temperature to 300°C.
  • Large scattering angle range, including grazing incidence angles for GIXRD or reflectivity measurements.
  • Compact system design for maximum portability and versatility​.

Please Note

Compatibility of a particular diffractometer will depend on its configuration.  Please discuss with our contact staff to understand if your system is suitable.

Related Products

Bulk Transmission Geometry

Working with high-energy x-rays offers some advantages in the study of bulk electro-mechanical materials. The Transmission Geometry system is ideally suited for use at high-energy synchrotron x-ray beamlines or lab sources with higher energy targets such as Ag or Mo. Precise polarization and strain measurements can be obtained in-situ at voltages up to ±7.5 kV.

Bulk Reflection Geometry

The Reflection Geometry system allows electric fields of ±5kV to be applied to bulk materials while conducting XRD measurements from a surface. Ideal for electro-ceramic and single crystal research in laboratory or synchrotron x-ray systems. Electrical current and displacements sensors are packaged within the unit allowing simultaneous strain and polarization measurements. 

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Demonstration

Related Products

Bulk Transmission Geometry

Working with high-energy x-rays offers some advantages in the study of bulk electro-mechanical materials. The Transmission Geometry system is ideally suited for use at high-energy synchrotron x-ray beamlines or lab sources with higher energy targets such as Ag or Mo. Precise polarization and strain measurements can be obtained in-situ at voltages up to ±7.5 kV.

Bulk Reflection Geometry

The Reflection Geometry system allows electric fields of ±5kV to be applied to bulk materials while conducting XRD measurements from a surface. Ideal for electro-ceramic and single crystal research in laboratory or synchrotron x-ray systems. Electrical current and displacements sensors are packaged within the unit allowing simultaneous strain and polarization measurements.