Description
The Thin Film measurement system packages an entire probe station into a compact head unit for use within existing XRD equipment. While conducting structural XRD measurements, static or cyclic fields between ±50V can be applied. Current, polarization, I-V and C-V curve measurements can be obtained simultaneously.
Specifications
- Suitable for most laboratory based x-ray diffractometers and synchrotron sources
- Compatible with: Bruker D8, Rigaku SmartLab, PanAnalytical Empyrean and X'Pert
- Depending on feature size of interest, x-ray beam focusing options may be required
- Polarization, I-V and C-V curve measurements in situ
- Applied voltages ±50V
- Sample diameters up to 15 mm with probe tip positioning over full area
- Sample/substrate thicknesses up to 3 mm
- Temperature range from room temperature to 300°C
- Large scattering angle range, including grazing incidence angles for GIXRD or reflectivity measurements
- Compact system design for maximum portability and versatility
Please Note
Compatibility of a particular diffractometer will depend on its configuration. Consult with the contact staff to determine if your system is suitable.
