Thin Film
– 1 minute to read
Description
Specifications
- Suitable for most laboratory based x-ray diffractometers and synchrotron sources.
- For example*: Bruker D8, Rigaku SmartLab, PanAnalytical Empyrean and X'Pert.
- Depending on feature size of interest, x-ray beam focusing options may be required.
- Polarization, I-V and C-V curve measurements in situ.
- Applied voltages ±50V.
- Sample diameters up to 15 mm with probe tip positioning over full area.
- Sample/substrate thicknesses up to 3 mm.
- Temperature range from room temperature to 300°C.
- Large scattering angle range, including grazing incidence angles for GIXRD or reflectivity measurements.
- Compact system design for maximum portability and versatility.
Please Note
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Image Gallery
Demonstration
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